Radiation Hardened Technology

Leaders in Radiation Hardened Memories. Nordic Semi Seattle LLC (Mobile Semi) radiation tested solutions are developed with the industry’s leading experience in designing to Radiation Hardened targets: Total Ionizing Dose (TID), Multi-Bit Upset (MBU), minimum critical charge (Qcrit) and Single Event Effects (SEE) including Single Event Latchup (SEL), Single Event Upset (SEU) and Single Event Transients (SET).

The Trailblaze™ software generates complete memory instances that meet leading aerospace and defense corporations’ stringent Radiation Hardening criteria. Optimized, embedded SRAMs by Mobile Semi also have the option to include the Trailblaze™ Built-in Self Test (BIST) Compiler for seamless integration of verification.

Nordic Semiconductor Seattle is registered for International Traffic in Arms Regulations (ITAR) as an SRAM and design service provider. Mobile Semi’s Rad Hard solutions come with broad and flexible IP rights and the full design databases for all instances. All Rad Hard development data is maintained in a separate secure network and location for which access is restricted to the specific project development team members only

Radiation Hardened by Design (RHBD), Nordic Semiconductor Seattle’s innovative design approach incorporates Triple Mode Redundancy (TMR), DICE latches and Qcrit optimization to reduce SET and SEU, as well as bit separation to reduce MBU. Semi’s RHBD techniques may be applied to both standard and Radiation Hardened CMOS processes, which includes enhancing designs using Radiation Hardened by process (RHBP).

Robust DICE latches and Triple Mode Redundancy (TMR) are used throughout Nordic Semiconductor Seattle Rad Hard designs to ensure soft error immunity. To further enhance yield, the Trailblaze™ software can instantiate optional redundancy columns in each memory sub-array of the single-port architectures.